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  • Open Access

    ARTICLE

    Computational Analysis of Novel Extended Lindley Progressively Censored Data

    Refah Alotaibi1, Mazen Nassar2,3, Ahmed Elshahhat4,*

    CMES-Computer Modeling in Engineering & Sciences, Vol.138, No.3, pp. 2571-2596, 2024, DOI:10.32604/cmes.2023.030582

    Abstract A novel extended Lindley lifetime model that exhibits unimodal or decreasing density shapes as well as increasing, bathtub or unimodal-then-bathtub failure rates, named the Marshall-Olkin-Lindley (MOL) model is studied. In this research, using a progressive Type-II censored, various inferences of the MOL model parameters of life are introduced. Utilizing the maximum likelihood method as a classical approach, the estimators of the model parameters and various reliability measures are investigated. Against both symmetric and asymmetric loss functions, the Bayesian estimates are obtained using the Markov Chain Monte Carlo (MCMC) technique with the assumption of independent gamma priors. From the Fisher information… More >

  • Open Access

    ARTICLE

    Reliability Analysis of HEE Parameters via Progressive Type-II Censoring with Applications

    Heba S. Mohammed1, Mazen Nassar2,3, Refah Alotaibi1, Ahmed Elshahhat4,*

    CMES-Computer Modeling in Engineering & Sciences, Vol.137, No.3, pp. 2761-2793, 2023, DOI:10.32604/cmes.2023.028826

    Abstract A new extended exponential lifetime model called Harris extended-exponential (HEE) distribution for data modelling with increasing and decreasing hazard rate shapes has been considered. In the reliability context, researchers prefer to use censoring plans to collect data in order to achieve a compromise between total test time and/or test sample size. So, this study considers both maximum likelihood and Bayesian estimates of the Harris extended-exponential distribution parameters and some of its reliability indices using a progressive Type-II censoring strategy. Under the premise of independent gamma priors, the Bayesian estimation is created using the squared-error and general entropy loss functions. Due… More >

  • Open Access

    ARTICLE

    Bayesian Analysis in Partially Accelerated Life Tests for Weighted Lomax Distribution

    Rashad Bantan1, Amal S. Hassan2, Ehab Almetwally3, M. Elgarhy4, Farrukh Jamal5, Christophe Chesneau6, Mahmoud Elsehetry7,*

    CMC-Computers, Materials & Continua, Vol.68, No.3, pp. 2859-2875, 2021, DOI:10.32604/cmc.2021.015422

    Abstract Accelerated life testing has been widely used in product life testing experiments because it can quickly provide information on the lifetime distributions by testing products or materials at higher than basic conditional levels of stress, such as pressure, temperature, vibration, voltage, or load to induce early failures. In this paper, a step stress partially accelerated life test (SS-PALT) is regarded under the progressive type-II censored data with random removals. The removals from the test are considered to have the binomial distribution. The life times of the testing items are assumed to follow length-biased weighted Lomax distribution. The maximum likelihood method… More >

  • Open Access

    ARTICLE

    Statistical Inference of Chen Distribution Based on Two Progressive Type-II Censoring Schemes

    Hassan M. Aljohani*

    CMC-Computers, Materials & Continua, Vol.66, No.3, pp. 2797-2814, 2021, DOI:10.32604/cmc.2021.013489

    Abstract An inverse problem in practical scientific investigations is the process of computing unknown parameters from a set of observations where the observations are only recorded indirectly, such as monitoring and controlling quality in industrial process control. Linear regression can be thought of as linear inverse problems. In other words, the procedure of unknown estimation parameters can be expressed as an inverse problem. However, maximum likelihood provides an unstable solution, and the problem becomes more complicated if unknown parameters are estimated from different samples. Hence, researchers search for better estimates. We study two joint censoring schemes for lifetime products in industrial… More >

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