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Atomistic Exploration of Deformation Properties of Copper Nanowires with Pre-Existing Defects

H.F. Zhan, Y.T. Gu1

School of Engineering Systems, Queensland University of Technology, Brisbane, QLD 4001, Australia

Computer Modeling in Engineering & Sciences 2011, 80(1), 23-56. https://doi.org/10.3970/cmes.2011.080.023

Abstract

Based on the embedded atom method (EAM) and molecular dynamics (MD) method, in this paper, the tensile deformation properties of Cu nanowires (NWs) with different pre-existing defects, including single surface defects, surface bi-defects and single internal defects, are systematically studied. In-depth deformation mechanisms of NWs with pre-existing defects are also explored. It is found that Young's modulus is insensitive to different pre-existing defects, but yield strength shows an obvious decrease. Defects are observed influencing greatly on NWs' tensile deformation mechanisms, and playing a role of dislocation sources. Besides of the traditional deformation process dominated by the nucleation and propagation of partial dislocations, the generations of twins, grain boundaries, fivefold deformation twins, hexagonal close-packed (HCP) structure and phase transformation from face-centred cubic (FCC) structure to HCP structure have been triggered by pre-existing defects. It is found that surface defect intends to induce larger influence to yield strength than internal defect. Most importantly, the defect that lies on slip planes exerts larger influence than other defects. As expected, it is also found that the more or longer of the defect, the bigger influence will be induced.

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APA Style
Zhan, H., Gu, Y. (2011). Atomistic exploration of deformation properties of copper nanowires with pre-existing defects. Computer Modeling in Engineering & Sciences, 80(1), 23-56. https://doi.org/10.3970/cmes.2011.080.023
Vancouver Style
Zhan H, Gu Y. Atomistic exploration of deformation properties of copper nanowires with pre-existing defects. Comput Model Eng Sci. 2011;80(1):23-56 https://doi.org/10.3970/cmes.2011.080.023
IEEE Style
H. Zhan and Y. Gu, "Atomistic Exploration of Deformation Properties of Copper Nanowires with Pre-Existing Defects," Comput. Model. Eng. Sci., vol. 80, no. 1, pp. 23-56. 2011. https://doi.org/10.3970/cmes.2011.080.023



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