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Data-Driven Screening of High-Performance Interconnect Materials: Integrating Graph Learning with Engineering Safety Constraints

Jiayi Tang1, Liang Cao2,*, Guanghui Xu1, Manqi Dong2, Ming Li3

1 Information Materials and Intelligent Sensing Laboratory of Anhui Province, Anhui University, No. 111 Jiulong Road, Hefei, China
2 School of Integrated Circuits, Anhui University, No. 111 Jiulong Road, Hefei, China
3 State Key Laboratory of Metal Matrix Composites, School of Materials Science and Engineering, Shanghai Jiao Tong University, No. 800 Dongchuan Road, Shanghai, China

* Corresponding Author: Liang Cao. Email: email

(This article belongs to the Special Issue: M5S: Multiphysics Modelling of Multiscale and Multifunctional Materials and Structures)

Computers, Materials & Continua 2026, 88(2), 21 https://doi.org/10.32604/cmc.2026.081488

Abstract

The accelerated design of next-generation semiconductor interconnects faces a critical “applicability gap”. Purely data-driven models effectively navigate vast chemical spaces, but they often yield candidates that are theoretically performant yet violate practical manufacturing constraints. To bridge this disconnect, this study proposes a neuro-symbolic decision support framework that systematically integrates inductive graph learning with deductive engineering logic for Safe-by-Design material screening. The framework operates through a hierarchical dual-stream architecture. First, an inductive Graph Neural Network (GNN) engine transforms 3D crystal structures into topological graph representations to predict thermodynamic stability and metallicity with high discriminative power (AUC = 0.868). Second, a deductive safety layer enforces explicit domain ontology, including toxicity thresholds, raw material costs, and reactivity limits, to preemptively prune high-risk candidates. Operationally, this hybrid approach reduces the candidate search space of over 20,000 compounds by approximately 96% within minutes, demonstrating orders-of-magnitude computational efficiency gains over traditional ab initio high-throughput screening. The system’s reliability is further validated through structural perturbation analysis and high-fidelity physics simulations, identifying robust binary compounds such as HfB and NbAl3 that exhibit cohesive energies up to 2.1 times that of copper. These results demonstrate the efficacy of integrating symbolic reasoning with deep learning to create transparent, reliability-aware computational tools for early-stage engineering decision-making.

Keywords

Neuro-symbolic AI; GNN; decision support systems; material informatics; safe-by-design; engineering constraints

Cite This Article

APA Style
Tang, J., Cao, L., Xu, G., Dong, M., Li, M. (2026). Data-Driven Screening of High-Performance Interconnect Materials: Integrating Graph Learning with Engineering Safety Constraints. Computers, Materials & Continua, 88(2), 21. https://doi.org/10.32604/cmc.2026.081488
Vancouver Style
Tang J, Cao L, Xu G, Dong M, Li M. Data-Driven Screening of High-Performance Interconnect Materials: Integrating Graph Learning with Engineering Safety Constraints. Comput Mater Contin. 2026;88(2):21. https://doi.org/10.32604/cmc.2026.081488
IEEE Style
J. Tang, L. Cao, G. Xu, M. Dong, and M. Li, “Data-Driven Screening of High-Performance Interconnect Materials: Integrating Graph Learning with Engineering Safety Constraints,” Comput. Mater. Contin., vol. 88, no. 2, pp. 21, 2026. https://doi.org/10.32604/cmc.2026.081488



cc Copyright © 2026 The Author(s). Published by Tech Science Press.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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