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Young's Modulus Measurement of Thin Films by Resonant Frequency Method Using Magnetostrictive Resonator

Hao-Miao Zhou1, Fang Li1, Qiang Ye1, Ji-Xiang Zhao1, Zhe-Lei Xia1, YingTang2, Jing Wei3

College of Information Engineering, China Jiliang University, Hangzhou, 310018, China. Tel: 086-0571-87676215; email: zhouhm@cjlu.edu.cn
College of Optical and Electronic Technology, China Jiliang University, Hangzhou, 310018, China
College of Foreign Languages, Zhejiang Gongshang University, Hangzhou, 310018, P. R. China

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