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EBSD-Based Microscopy: Resolution of Dislocation Density

Brent L. Adams, Joshua Kacher

Computers, Materials & Continua 2009, 14(3), 185-196.


Consideration is given to the resolution of dislocation density afforded by EBSD-based scanning electron microscopy. Comparison between the conventional Hough- and the emerging high-resolution cross-correlation-based approaches is made. It is illustrated that considerable care must be exercised in selecting a step size (Burger's circuit size) for experimental measurements. Important variables affecting this selection include the dislocation density and the physical size and density of dislocation dipole and multi-pole components of the structure. It is also illustrated that simulations can be useful to the interpretation of experimental recoveries.


Cite This Article

B. L. . Adams and J. . Kacher, "Ebsd-based microscopy: resolution of dislocation density," Computers, Materials & Continua, vol. 14, no.3, pp. 185–196, 2009.

This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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