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SAM Era: Can It Segment Any Industrial Surface Defects?

Kechen Song1,2,*, Wenqi Cui2, Han Yu1, Xingjie Li1, Yunhui Yan2,*

1 National Key Laboratory of Advanced Casting Technologies, Shenyang, 110022, China
2 School of Mechanical Engineering & Automation, Northeastern University, Shenyang, 110819, China

* Corresponding Authors: Kechen Song. Email: email; Yunhui Yan. Email: email

(This article belongs to the Special Issue: Machine Vision Detection and Intelligent Recognition)

Computers, Materials & Continua 2024, 78(3), 3953-3969. https://doi.org/10.32604/cmc.2024.048451

Abstract

Segment Anything Model (SAM) is a cutting-edge model that has shown impressive performance in general object segmentation. The birth of the segment anything is a groundbreaking step towards creating a universal intelligent model. Due to its superior performance in general object segmentation, it quickly gained attention and interest. This makes SAM particularly attractive in industrial surface defect segmentation, especially for complex industrial scenes with limited training data. However, its segmentation ability for specific industrial scenes remains unknown. Therefore, in this work, we select three representative and complex industrial surface defect detection scenarios, namely strip steel surface defects, tile surface defects, and rail surface defects, to evaluate the segmentation performance of SAM. Our results show that although SAM has great potential in general object segmentation, it cannot achieve satisfactory performance in complex industrial scenes. Our test results are available at: .

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APA Style
Song, K., Cui, W., Yu, H., Li, X., Yan, Y. (2024). SAM era: can it segment any industrial surface defects?. Computers, Materials & Continua, 78(3), 3953-3969. https://doi.org/10.32604/cmc.2024.048451
Vancouver Style
Song K, Cui W, Yu H, Li X, Yan Y. SAM era: can it segment any industrial surface defects?. Comput Mater Contin. 2024;78(3):3953-3969 https://doi.org/10.32604/cmc.2024.048451
IEEE Style
K. Song, W. Cui, H. Yu, X. Li, and Y. Yan, “SAM Era: Can It Segment Any Industrial Surface Defects?,” Comput. Mater. Contin., vol. 78, no. 3, pp. 3953-3969, 2024. https://doi.org/10.32604/cmc.2024.048451



cc Copyright © 2024 The Author(s). Published by Tech Science Press.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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