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FD-YOLO: An Attention-Augmented Lightweight Network for Real-Time Industrial Fabric Defect Detection

Shaobo Kang, Mingzhi Yang*

School of Electrical Engineering and Automation, Xiamen University of Technology, Xiamen, 361024, China

* Corresponding Author: Mingzhi Yang. Email: email

Computers, Materials & Continua 2026, 86(2), 1-23. https://doi.org/10.32604/cmc.2025.071488

Abstract

Fabric defect detection plays a vital role in ensuring textile quality. However, traditional manual inspection methods are often inefficient and inaccurate. To overcome these limitations, we propose FD-YOLO, an enhanced lightweight detection model based on the YOLOv11n framework. The proposed model introduces the Bi-level Routing Attention (BRAttention) mechanism to enhance defect feature extraction, enabling more detailed feature representation. It proposes Deep Progressive Cross-Scale Fusion Neck (DPCSFNeck) to better capture small-scale defects and incorporates a Multi-Scale Dilated Residual (MSDR) module to strengthen multi-scale feature representation. Furthermore, a Shared Detail-Enhanced Lightweight Head (SDELHead) is employed to reduce the risk of gradient explosion during training. Experimental results demonstrate that FD-YOLO achieves superior detection accuracy and Lightweight performance compared to the baseline YOLOv11n.

Keywords

Deep learning; YOLO; fabric defect inspection; multi-scale attention; lightweight head

Cite This Article

APA Style
Kang, S., Yang, M. (2026). FD-YOLO: An Attention-Augmented Lightweight Network for Real-Time Industrial Fabric Defect Detection. Computers, Materials & Continua, 86(2), 1–23. https://doi.org/10.32604/cmc.2025.071488
Vancouver Style
Kang S, Yang M. FD-YOLO: An Attention-Augmented Lightweight Network for Real-Time Industrial Fabric Defect Detection. Comput Mater Contin. 2026;86(2):1–23. https://doi.org/10.32604/cmc.2025.071488
IEEE Style
S. Kang and M. Yang, “FD-YOLO: An Attention-Augmented Lightweight Network for Real-Time Industrial Fabric Defect Detection,” Comput. Mater. Contin., vol. 86, no. 2, pp. 1–23, 2026. https://doi.org/10.32604/cmc.2025.071488



cc Copyright © 2026 The Author(s). Published by Tech Science Press.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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