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A Novel Method for Determining the Void Fraction in Gas-Liquid Multi-Phase Systems Using a Dynamic Conductivity Probe

Xiaochu Luo1, Xiaobing Qi2, Zhao Luo3, Zhonghao Li4, Ruiquan Liao1, Xingkai Zhang1,*
1 Hubei Key Laboratory of Oil and Gas Drilling and Production Engineering, Yangtze University, Wuhan, 434000, China
2 Oil and Gas Engineering Research Institute, PetroChina Tarim Oilfield Company, Korla, 84100, China
3 Xinjiang Kunlun Engineering Consulting Co., Ltd., Karamay, 834000, China
4 Petrochina Dagang Oilfield Company Production Technology Research Institute, Tianjin, 300000, China
* Corresponding Author: Xingkai Zhang. Email: email

Fluid Dynamics & Materials Processing https://doi.org/10.32604/fdmp.2023.045737

Received 06 September 2023; Accepted 28 November 2023; Published online 15 January 2024

Abstract

Conventional conductivity methods for measuring the void fraction in gas-liquid multiphase systems are typically affected by accuracy problems due to the presence of fluid flow and salinity. This study presents a novel approach for determining the void fraction based on a reciprocating dynamic conductivity probe used to measure the liquid film thickness under forced annular-flow conditions. The measurement system comprises a cyclone, a conductivity probe, a probe reciprocating device, and a data acquisition and processing system. This method ensures that the flow pattern is adjusted to a forced annular flow, thereby minimizing the influence of complex and variable gas-liquid flow patterns on the measurement results; Moreover, it determines the liquid film thickness solely according to circuit connectivity rather than specific conductivity values, thereby mitigating the impact of salinity. The reliability of the measurement system is demonstrated through laboratory experiments. The experimental results indicate that, in a range of gas phase superficial velocities 5–20 m/s and liquid phase superficial velocities 0.079–0.48 m/s, the maximum measurement deviation for the void fraction is 4.23%.

Keywords

Forced annular flow; dynamic conductivity probe; void fraction; gas-liquid flow; liquid film thickness
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