Table of Content

Open Access

ABSTRACT

Phase-field simulation of domain evolution in ferroelectric thin films with deadlayers

Yifan Xia, Jie Wang

The International Conference on Computational & Experimental Engineering and Sciences 2011, 20(3), 87-88. https://doi.org/10.3970/icces.2011.020.087

Abstract

Phase field simulation is an effective way to predict the domain evolution in ferroelectric materials. A phase field model is developed to investigate the domain structures and polarization switching in in ferroelectric thin films with deadlayers. Simulation results show that the deadlayers as well as misfit strain have a significant influence on the domain structures and polarization switching in the ferroelectric thin films. It is found that the simulated switching electric field in ferroelectric thin films decreases with the thickness of the deadlayers increasing.

Cite This Article

Xia, Y., Wang, J. (2011). Phase-field simulation of domain evolution in ferroelectric thin films with deadlayers. The International Conference on Computational & Experimental Engineering and Sciences, 20(3), 87–88.



This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
  • 678

    View

  • 563

    Download

  • 0

    Like

Share Link

WeChat scan