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Leaf architecture characters of Vachellia tortilis (Forssk.) Galasso and Banfi along longitudinal gradient in Limpopo Province, South Africa

Mashile SP1,2, MP Tshisikhawe1

1 Department of Botany, University of Venda, Private Bag X5050, Thohoyandou 0950, South Africa.
2 South African National Biodiversity Institute, Private Bag X101, Pretoria, 0001, South Africa.

* Corresponding Author:Address Correspondence to: Peter Milingoni Tshisikhawe, e-mail: email

Phyton-International Journal of Experimental Botany 2015, 84(2), 473-477. https://doi.org/10.32604/phyton.2015.84.473

Abstract

This paper looked at the leaf architecture characteristics of Vachellia tortilis to determine if either there is or not an effect of the tropic line on plants. Vachellia tortilis leaves were sampled along a national road (N1) in Limpopo province. Sampling points were set 10 km apart away from the Tropic of Capricon in opposite directions. Leaf morphology revealed that leaves of V. tortilis are bipinnately compound with alternate arrangement. The venation pattern of the pinnules was eucamptodromus and brochidodromous with imperfect reticulation. Areoles were imperfect and pentagonal or irregular in shape.

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APA Style
SP, M., Tshisikhawe, M. (2015). Leaf architecture characters of vachellia tortilis (forssk.) galasso and banfi along longitudinal gradient in limpopo province, south africa. Phyton-International Journal of Experimental Botany, 84(2), 473-477. https://doi.org/10.32604/phyton.2015.84.473
Vancouver Style
SP M, Tshisikhawe M. Leaf architecture characters of vachellia tortilis (forssk.) galasso and banfi along longitudinal gradient in limpopo province, south africa. Phyton-Int J Exp Bot. 2015;84(2):473-477 https://doi.org/10.32604/phyton.2015.84.473
IEEE Style
M. SP and M. Tshisikhawe, "Leaf architecture characters of Vachellia tortilis (Forssk.) Galasso and Banfi along longitudinal gradient in Limpopo Province, South Africa," Phyton-Int. J. Exp. Bot., vol. 84, no. 2, pp. 473-477. 2015. https://doi.org/10.32604/phyton.2015.84.473



cc Copyright © 2015 The Author(s). Published by Tech Science Press.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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