Kun Zhu1, Nana Zhang1, Shi Ying1, *, Xu Wang2
CMC-Computers, Materials & Continua, Vol.63, No.2, pp. 891-910, 2020, DOI:10.32604/cmc.2020.08096
Abstract With the continuous expansion of software scale, software update and
maintenance have become more and more important. However, frequent software code
updates will make the software more likely to introduce new defects. So how to predict the
defects quickly and accurately on the software change has become an important problem
for software developers. Current defect prediction methods often cannot reflect the feature
information of the defect comprehensively, and the detection effect is not ideal enough.
Therefore, we propose a novel defect prediction model named ITNB (Improved Transfer
Naive Bayes) based on improved transfer Naive Bayesian algorithm in this paper, which… More >
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