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    Within-Project and Cross-Project Software Defect Prediction Based on Improved Transfer Naive Bayes Algorithm

    Kun Zhu1, Nana Zhang1, Shi Ying1, *, Xu Wang2

    CMC-Computers, Materials & Continua, Vol.63, No.2, pp. 891-910, 2020, DOI:10.32604/cmc.2020.08096

    Abstract With the continuous expansion of software scale, software update and maintenance have become more and more important. However, frequent software code updates will make the software more likely to introduce new defects. So how to predict the defects quickly and accurately on the software change has become an important problem for software developers. Current defect prediction methods often cannot reflect the feature information of the defect comprehensively, and the detection effect is not ideal enough. Therefore, we propose a novel defect prediction model named ITNB (Improved Transfer Naive Bayes) based on improved transfer Naive Bayesian… More >

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