Abeer Abdulaziz AlArfaj, Hanan Ahmed Hosni Mahmoud*
CMC-Computers, Materials & Continua, Vol.73, No.3, pp. 5655-5669, 2022, DOI:10.32604/cmc.2022.031135
Abstract Lie detection test is highly significant task due to its impact on criminology and society. Computerized lie detection test model using electroencephalogram (EEG) signals is studied in literature. In this paper we studied deep learning framework in lie detection test paradigm. First, we apply a preprocessing technique to utilize only a small fragment of the EEG image instead of the whole image. Our model describes a temporal feature map of the EEG signals measured during the lie detection test. A deep learning attention model (V-TAM) extracts the temporal map vector during the learning process. This technique reduces computational time and… More >
Login
Register
