J. Sladek1,2, V. Sladek1, E. Pan3, D.L. Young4
CMES-Computer Modeling in Engineering & Sciences, Vol.99, No.4, pp. 273-296, 2014, DOI:10.3970/cmes.2014.099.273
Abstract This paper presents a dynamic analysis of an anti-plane crack in functionally graded piezoelectric semiconductors. General boundary conditions and sample geometry are allowed in the proposed formulation. The coupled governing partial differential equations (PDEs) for shear stresses, electric displacement field and current are satisfied in a local weak-form on small fictitious subdomains. The derived local integral equations involve one order lower derivatives than the original PDEs. All field quantities are approximated by the moving least-squares (MLS) scheme. After performing spatial integrations, we obtain a system of ordinary differential equations for the involved nodal unknowns. It is noted that the stresses… More >
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