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    Identification of Abnormal Patterns in AR (1) Process Using CS-SVM

    Hongshuo Zhang1, Bo Zhu1,*, Kaimin Pang1, Chunmei Chen1, Yuwei Wan2

    Intelligent Automation & Soft Computing, Vol.28, No.3, pp. 797-810, 2021, DOI:10.32604/iasc.2021.017232

    Abstract Using machine learning method to recognize abnormal patterns covers the shortage of traditional control charts for autocorrelation processes, which violate the applicable conditions of the control chart, i.e., the independent identically distributed (IID) assumption. In this study, we propose a recognition model based on support vector machine (SVM) for the AR (1) type of autocorrelation process. For achieving a higher recognition performance, the cuckoo search algorithm (CS) is used to optimize the two hyper-parameters of SVM, namely the penalty parameter c and the radial basis kernel parameter g. By using Monte Carlo simulation methods, the data sets containing samples of… More >

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