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The structure polymer/As-Se-S doped by Bi for X-ray imaging

A. Chiritaa,*, A. Hustucb, N. Nasedchinaa, S. Vatavua

a Semiconductors Physics and Devices Laboratory, Physics and Engineering Faculty, Moldova State University, Chisinau, Republic of Moldova
b Alarad SRL, Chisinau, Republic of Moldova

* Corresponding Author: email

Chalcogenide Letters 2023, 20(11), 803-809. https://doi.org/10.15251/CL.2023.2011.803

Abstract

The polymer/67at %(As2S3)0.985(Bi2Se3)0.015:33 at.% As2Se3 structure for X-ray imaging has been investigated. The possibility of registering relief-phase images for radiation of “white” spectrum of tungsten anode X-ray tube was shown.

Keywords

X-ray imaging, Chalcogenide glassy semiconductors, Thermoplastic

Cite This Article

APA Style
Chirita, A., Hustuc, A., Nasedchina, N., Vatavu, S. (2023). The structure polymer/As-Se-S doped by Bi for X-ray imaging. Chalcogenide Letters, 20(11), 803–809. https://doi.org/10.15251/CL.2023.2011.803
Vancouver Style
Chirita A, Hustuc A, Nasedchina N, Vatavu S. The structure polymer/As-Se-S doped by Bi for X-ray imaging. Chalcogenide Letters. 2023;20(11):803–809. https://doi.org/10.15251/CL.2023.2011.803
IEEE Style
A. Chirita, A. Hustuc, N. Nasedchina, and S. Vatavu, “The structure polymer/As-Se-S doped by Bi for X-ray imaging,” Chalcogenide Letters, vol. 20, no. 11, pp. 803–809, 2023. https://doi.org/10.15251/CL.2023.2011.803



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