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ARTICLE

Fabrication and evaluation of CuAlSe₂/Si photodetector

H. K. Hassun^a, B. K. H. Al-Maiyaly^a, A. H. Shaban^b,*

a Department of physics, college of Education for pure sciences Ibn Al-Haitham, University of Baghdad, Iraq
b College of Science, University of Baghdad, Baghdad, Iraq

* Corresponding Author:

Chalcogenide Letters 2023, 20(2), 145-152. https://doi.org/10.15251/CL.2023.202.145

Received 19 November 2022; Accepted 14 February 2023;

Abstract

In this work, we have examined the spectral response of (p-CuAlSe₂/n-Si) detector, (CAS) thin films deposited by thermal evaporation at RT with a thickness (450) nm, and annealing temperature at (473K) for 2 h. Optical transmission measurements displayed reasonably slight transmission besides higher absorbance trendy the visible region, energy gaps were observed by annealing, were found to be direct, and decreased with the effect of annealing. The extreme responsivity value arises at wavelength 459 nm, with improvement value of specific detectivity and quantum efficiency the annealing films be situated originate as greatest suitable aimed at numerous device application.

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Keywords

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