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Preparation and characterization of CuAlXSn1-XS2 thin films prepared by electron beam deposition system

A. S. Alqarnia,, S. N. Alamrib,

a Department of Physics, College of Science, Princess Nourah bint Abdulrahman University, P.O. Box 84428, Riyadh 11671, Saudi Arabia
b Department of Physics, Faculty of Science, Taibah University, Madinah, Saudi Arabia

* Corresponding Author: email

Chalcogenide Letters 2025, 22(5), 493-506. https://doi.org/10.15251/CL.2025.225.493

Abstract

Abundant and environmentally friendly solar cells materials Cu2AlSnS4 (CATS) thin film successively prepared by electron beam deposition system. The impact of various deposition times and post-annealing at 450 °C under nitrogen gas atmosphere on the structures, morphologies, and spectroscopic characteristics of the obtained CATS films were investigated. Both deposition time variation and annealing process were found to significantly affect the crystallinity, bonding vibration, surface morphology, energy band gaps, and Urbach energy of the CATS films. EDX spectra of the films disclosed the existence of all constituents’ elements. XRD analysis of the post-annealed films verified their multiple phases with varying crystallite sizes. Raman spectral data of these films agreed with the XRD analysis. AFM and SEM images of the films revealed the growth of hemi-spherical crystallites on their surface. The band gap energy of these as deposited and annealed films was correspondingly varied from 1.26 - 1.59 eV and 1.14 - 0.94 eV. The proposed CATS films are asserted to be promising for the advancement of novel solar cell materials.

Keywords

CATS thin film, Electron beam deposition (EBD), Structure, Morphology, Transmittance

Cite This Article

APA Style
Alqarni, A.S., Alamri, S.N. (2025). Preparation and characterization of CuAlXSn1-XS2 thin films prepared by electron beam deposition system. Chalcogenide Letters, 22(5), 493–506. https://doi.org/10.15251/CL.2025.225.493
Vancouver Style
Alqarni AS, Alamri SN. Preparation and characterization of CuAlXSn1-XS2 thin films prepared by electron beam deposition system. Chalcogenide Letters. 2025;22(5):493–506. https://doi.org/10.15251/CL.2025.225.493
IEEE Style
A.S. Alqarni and S.N. Alamri, “Preparation and characterization of CuAlXSn1-XS2 thin films prepared by electron beam deposition system,” Chalcogenide Letters, vol. 22, no. 5, pp. 493–506, 2025. https://doi.org/10.15251/CL.2025.225.493



cc Copyright © 2025 The Author(s). Published by Tech Science Press.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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