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An Improved Interval-Valued Picture Fuzzy TOPSIS Approach Based on New Divergence Measures for Risk Assessment
1 Department of Applied Mathematics and Statistics, Johns Hopkins University, Baltimore, MD 21218, USA
2 Cw Chu College, Jiangsu Normal University, Xuzhou, 221116, China
3 Department of Computer Science, College of Computer Science, King Khalid University, Abha, 62521, Saudi Arabia
4 Symbiosis Institute of Technology, Hyderabad Campus, Symbiosis International (Deemed University), Pune, 412115, India
5 Jadara Research Center, Jadara University, Irbid, 21110, Jordan
6 College of Mathematics and Computer, Xinyu University, Xinyu, 338004, China
7 School of Computer Sciences, Universiti Sains Malaysia, Penang, 11800, Malaysia
* Corresponding Authors: Prasanalakshmi Balaji. Email: ; Zhe Liu. Email:
(This article belongs to the Special Issue: Algorithms, Models, and Applications of Fuzzy Optimization and Decision Making)
Computer Modeling in Engineering & Sciences 2025, 144(2), 2099-2121. https://doi.org/10.32604/cmes.2025.068734
Received 05 June 2025; Accepted 18 July 2025; Issue published 31 August 2025
Abstract
While interval-valued picture fuzzy sets (IvPFSs) provide a powerful tool for modeling uncertainty and ambiguity in various fields, existing divergence measures for IvPFSs remain limited and often produce counterintuitive results. To address these shortcomings, this paper introduces two novel divergence measures for IvPFSs, inspired by the Jensen-Shannon divergence. The fundamental properties of the proposed measures—non-degeneracy, symmetry, triangular inequality, and boundedness—are rigorously proven. Comparative analyses with existing measures are conducted through specific cases and numerical examples, clearly demonstrating the advantages of our approach. Furthermore, we apply the new divergence measures to develop an enhanced interval-valued picture fuzzy TOPSIS method for risk assessment in construction projects, showing the practical applicability and effectiveness of our contributions.Keywords
Cite This Article
Copyright © 2025 The Author(s). Published by Tech Science Press.This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


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