Harsh Tripathi1, Amer Ibrahim Al-Omari2, Mahendra Saha1, Ayed R. A. Alanzi3,*
Computer Systems Science and Engineering, Vol.38, No.3, pp. 381-392, 2021, DOI:10.32604/csse.2021.015624
Abstract Recently, the Darna distribution has been introduced as a new lifetime distribution. The two-parameter Darna distribution represents is a mixture of two well-known gamma and exponential distributions. A manufacturer or an engineer of products conducts life testing to examine whether the quality level of products meets the customer’s requirements, such as reliability or the minimum lifetime. In this article, an attribute modified chain sampling inspection plan based on the time truncated life test is proposed for items whose lifetime follows the Darna distribution. The plan parameters, including the sample size, the acceptance number, and the past lot result of the… More >
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