Rashad Bantan1, Amal S. Hassan2, Ehab Almetwally3, M. Elgarhy4, Farrukh Jamal5, Christophe Chesneau6, Mahmoud Elsehetry7,*
CMC-Computers, Materials & Continua, Vol.68, No.3, pp. 2859-2875, 2021, DOI:10.32604/cmc.2021.015422
Abstract Accelerated life testing has been widely used in product life testing experiments because it can quickly provide information on the lifetime distributions by testing products or materials at higher than basic conditional levels of stress, such as pressure, temperature, vibration, voltage, or load to induce early failures. In this paper, a step stress partially accelerated life test (SS-PALT) is regarded under the progressive type-II censored data with random removals. The removals from the test are considered to have the binomial distribution. The life times of the testing items are assumed to follow length-biased weighted Lomax distribution. The maximum likelihood method… More >
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