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    New Method for Computer Identification Through Electromagnetic Radiation

    Jun Shi1, Zhujun Zhang2, Yangyang Li1,*, Rui Wang1, Hao Shi1, Xile Li3

    CMC-Computers, Materials & Continua, Vol.57, No.1, pp. 69-80, 2018, DOI:10.32604/cmc.2018.03688

    Abstract The electromagnetic waves emitted from devices can be a source of information leakage and can cause electromagnetic compatibility (EMC) problems. Electromagnetic radiation signals from computer displays can be a security risk if they are intercepted and reconstructed. In addition, the leaks may reveal the hardware information of the computer, which is more important for some attackers, protectors and security inspection workers. In this paper, we propose a statistical distribution based algorithm (SD algorithm) to extracted eigenvalues from electromagnetic radiate video signals, and then classified computers by using classifier based on Bayesian and SVM. We can More >

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