Ya Tu1, Yun Lin1, Jin Wang2,3,*, Jeong-Uk Kim4
CMC-Computers, Materials & Continua, Vol.55, No.2, pp. 243-254, 2018, DOI:10.3970/cmc.2018.01755
Abstract Deep Learning (DL) is such a powerful tool that we have seen tremendous success in areas such as Computer Vision, Speech Recognition, and Natural Language Pro-cessing. Since Automated Modulation Classification (AMC) is an important part in Cognitive Radio Networks, we try to explore its potential in solving signal modula-tion recognition problem. It cannot be overlooked that DL model is a complex mod-el, thus making them prone to over-fitting. DL model requires many training data to combat with over-fitting, but adding high quality labels to training data manually is not always cheap and accessible, especially in real-time system, which may counter… More >
Login
Register
