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    Strain Measurement in a Microstructure Using Digital Image Correlation for a Laser-Scanning Microscopic Image

    N. Shishido, T. Ikeda, N. Miyazaki

    CMES-Computer Modeling in Engineering & Sciences, Vol.35, No.1, pp. 1-20, 2008, DOI:10.3970/cmes.2008.035.001

    Abstract We propose an image correction method that will accurately measure full-field displacement in a microstructure using the digital image correlation method (DICM); the proposed method is suitable for use with laser-scanned images. Laser scanning microscopes have higher spatial resolution and deeper depth of field than optical microscopes, but errors in laser scanning position (time-dependent distortion) affect the accuracy of the DICM. The proposed image correction method involves the removal of both time-dependant and time-independent distortions. Experimental results using images of prescribed rigid-body motions demonstrate that the proposed correction method is capable of identifying and removing… More >

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