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    Improved Fully Convolutional Network for Digital Image Region Forgery Detection

    Jiwei Zhang1, Yueying Li2, Shaozhang Niu1,*, Zhiyi Cao1, Xinyi Wang1

    CMC-Computers, Materials & Continua, Vol.60, No.1, pp. 287-303, 2019, DOI:10.32604/cmc.2019.05353

    Abstract With the rapid development of image editing techniques, the image splicing behavior, typically for those that involve copying a portion from one original image into another targeted image, has become one of the most prevalent challenges in our society. The existing algorithms relying on hand-crafted features can be used to detect image splicing but unfortunately lack precise location information of the tampered region. On the basis of changing the classifications of fully convolutional network (FCN), here we proposed an improved FCN that enables locating the spliced region. Specifically, we first insert the original images into… More >

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