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  • Open Access

    ARTICLE

    Parameter Estimation Based on Censored Data under Partially Accelerated Life Testing for Hybrid Systems due to Unknown Failure Causes

    Mustafa Kamal*

    CMES-Computer Modeling in Engineering & Sciences, Vol.130, No.3, pp. 1239-1269, 2022, DOI:10.32604/cmes.2022.017532

    Abstract In general, simple subsystems like series or parallel are integrated to produce a complex hybrid system. The reliability of a system is determined by the reliability of its constituent components. It is often extremely difficult or impossible to get specific information about the component that caused the system to fail. Unknown failure causes are instances in which the actual cause of system failure is unknown. On the other side, thanks to current advanced technology based on computers, automation, and simulation, products have become incredibly dependable and trustworthy, and as a result, obtaining failure data for testing such exceptionally reliable items… More >

  • Open Access

    ARTICLE

    Bayesian Analysis in Partially Accelerated Life Tests for Weighted Lomax Distribution

    Rashad Bantan1, Amal S. Hassan2, Ehab Almetwally3, M. Elgarhy4, Farrukh Jamal5, Christophe Chesneau6, Mahmoud Elsehetry7,*

    CMC-Computers, Materials & Continua, Vol.68, No.3, pp. 2859-2875, 2021, DOI:10.32604/cmc.2021.015422

    Abstract Accelerated life testing has been widely used in product life testing experiments because it can quickly provide information on the lifetime distributions by testing products or materials at higher than basic conditional levels of stress, such as pressure, temperature, vibration, voltage, or load to induce early failures. In this paper, a step stress partially accelerated life test (SS-PALT) is regarded under the progressive type-II censored data with random removals. The removals from the test are considered to have the binomial distribution. The life times of the testing items are assumed to follow length-biased weighted Lomax distribution. The maximum likelihood method… More >

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