E. Poovannan*, S. Karthik
CMC-Computers, Materials & Continua, Vol.74, No.1, pp. 2161-2177, 2023, DOI:10.32604/cmc.2023.032512
Abstract The difference between circuit design stage and time requirements has broadened with the increasing complexity of the circuit. A big database is needed to undertake important analytical work like statistical method, heat research, and IR-drop research that results in extended running times. This unit focuses on the assessment of test strength. Because of the enormous number of successful designs for current models and the unnecessary time required for every test, maximum energy ratings with all tests cannot be achieved. Nevertheless, test safety is important for producing trustworthy findings to avoid loss of output and harm to the chip. Generally, effective… More >
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