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    Modeling and Characterization of Grain Scale Strain Distribution in Polycrystalline Tantalum

    C. A. Bronkhorst1,2, A. R. Ross3, B. L. Hansen1, E. K. Cerreta2, J. F. Bingert2

    CMC-Computers, Materials & Continua, Vol.17, No.2, pp. 149-174, 2010, DOI:10.3970/cmc.2010.017.149

    Abstract A common sample geometry used to study shear localization is the "tophat": an axi-symmetric sample with an upper "hat" portion and a lower "brim" portion. The gage section lies between the hat and brim. The gage section length is on the order of 0.9 mm with deformation imposed through a Split-Hopkinson Pressure Bar system at maximum top-to-bottom velocity in the range of 10-25 m/sec. Detailed metallographic analysis has been performed on sections of the samples to quantify the topology and deformation state of the material after large deformation shear. These experiments performed with polycrystalline tantalum have been modeled using a… More >

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