Zhongqing Zhang1, Bo Wan1,*, Guicui Fu1, Yutai Su2,*, Zhaoxi Wu3, Xiangfen Wang1, Xu Long2
CMES-Computer Modeling in Engineering & Sciences, Vol.139, No.1, pp. 441-458, 2024, DOI:10.32604/cmes.2023.043616
Abstract Sintered silver nanoparticles (AgNPs) are widely used in high-power electronics due to their exceptional properties. However, the material reliability is significantly affected by various microscopic defects. In this work, the three primary micro-defect types at potential stress concentrations in sintered AgNPs are identified, categorized, and quantified. Molecular dynamics (MD) simulations are employed to observe the failure evolution of different microscopic defects. The dominant mechanisms responsible for this evolution are dislocation nucleation and dislocation motion. At the same time, this paper clarifies the quantitative relationship between the tensile strain amount and the failure mechanism transitions of the three defect types by… More >
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