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    Anti-plane Circular Nano-inclusion Problem with Electric Field Gradient and Strain Gradient Effects

    Shasha Yang, Shengping Shen1

    CMC-Computers, Materials & Continua, Vol.40, No.3, pp. 219-239, 2014, DOI:10.3970/cmc.2014.040.219

    Abstract As well known, gradient theories can describe size effects that are important in nano-scale problems. In this paper, we analyze the Eshelby-type anti-plane inclusion problem embedded in infinite dielectric body by considering both strain gradient and electric field gradient effects to account for the size effect and high-order electromechanical coupling effect. The size-dependent Eshelby and Eshelby-like tensor, strain, stress, electric field and electric displacement components are derived explicitly by means of Green's function method. Theoretical results indicate that strain and electric field are decoupled for anti-plane inclusion problem while stress field and electric displacement are coupled through strain gradient and… More >

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