Bingfei Liu¹, Guansuo Dui^2,3, Benming Xie¹, Libiao Xin³, Lijun Xue³

CMC-Computers, Materials & Continua, Vol.34, No.1, pp. 83-94, 2013, DOI:10.3970/cmc.2013.034.083

Abstract Functionally Graded Materials (FGMs) are being used in an everexpanding set of applications. For better applications, an analytical methodology using averaging technique of composites is developed to describe the thermo-elastic and thermo-elastoplastic behaviors of a three-layered FGM system subjected to thermal loading Solutions using averaging technique of composites for the stress distributions in a generic FGM system subjected to arbitrary temperature loading conditions are presented. The power-law strain hardening behaviour is assumed for the FGM metallic phase and the stress of the metallic phase are calculated to judge the plastic in this work The stress distributions within the FGM systems… More >

Chein-Shan Liu¹

CMC-Computers, Materials & Continua, Vol.18, No.1, pp. 1-20, 2010, DOI:10.3970/cmc.2010.018.001

Abstract We are concerned with the reconstruction of an unknown space-dependent rigidity coefficient in a wave equation. This problem is known as one of the inverse scattering problems. Based on a two-point Lie-group equation we develop a Lie-group adaptive method (LGAM) to solve this inverse scattering problem through iterations, which possesses a special character that by using onlytwo boundary conditions and two initial conditions, as those used in the direct problem, we can effectively reconstruct the unknown rigidity function by aself-adaption between the local in time differential governing equation and the global in time algebraic Lie-group equation. The accuracy and efficiency… More >

C.M. Hefferan¹, S.F. Li¹, J. Lind¹, U. Lienert², A.D. Rollett³, P. Wynblatt³, R.M. Suter^1,3

CMC-Computers, Materials & Continua, Vol.14, No.3, pp. 209-220, 2009, DOI:10.3970/cmc.2009.014.209

Abstract We have measured and reconstructed via forward modeling a small volume of microstructure of high purity, well annealed nickel using high energy x-ray diffraction microscopy (HEDM). Statistical distributions characterizing grain orientations, intra-granular misorientations, and nearest neighbor grain misorientations are extracted. Results are consistent with recent electron backscatter diffraction measurements. Peaks in the grain neighbor misorientation angle distribution at 60 degrees (∑3) and 39 degrees (∑9) have resolution limited widths of ≈ 0.14 degree FWHM. The analysis demonstrates that HEDM can recover grain and grain boundary statistics comparable to OIM volume measurements; more extensive data sets will lead to full, five… More >