Home / Advanced Search

  • Title/Keywords

  • Author/Affliations

  • Journal

  • Article Type

  • Start Year

  • End Year

Update SearchingClear
  • Articles
  • Online
Search Results (1)
  • Open Access

    ARTICLE

    Material-SAM: Adapting SAM for Material XCT

    Xuelong Wu1, Junsheng Wang1,*, Zhongyao Li1, Yisheng Miao1, Chengpeng Xue1, Yuling Lang2, Decai Kong2, Xiaoying Ma2, Haibao Qiao2

    CMC-Computers, Materials & Continua, Vol.78, No.3, pp. 3703-3720, 2024, DOI:10.32604/cmc.2024.047027

    Abstract X-ray Computed Tomography (XCT) enables non-destructive acquisition of the internal structure of materials, and image segmentation plays a crucial role in analyzing material XCT images. This paper proposes an image segmentation method based on the Segment Anything model (SAM). We constructed a dataset of carbide in nickel-based single crystal superalloys XCT images and preprocessed the images using median filtering, histogram equalization, and gamma correction. Subsequently, SAM was fine-tuned to adapt to the task of material XCT image segmentation, resulting in Material-SAM. We compared the performance of threshold segmentation, SAM, U-Net model, and Material-SAM. Our method achieved 88.45% Class Pixel Accuracy… More >

Displaying 1-10 on page 1 of 1. Per Page