Rashad Bantan¹, Amal S. Hassan², Ehab Almetwally³, M. Elgarhy⁴, Farrukh Jamal⁵, Christophe Chesneau⁶, Mahmoud Elsehetry^7,*

CMC-Computers, Materials & Continua, Vol.68, No.3, pp. 2859-2875, 2021, DOI:10.32604/cmc.2021.015422

Abstract Accelerated life testing has been widely used in product life testing experiments because it can quickly provide information on the lifetime distributions by testing products or materials at higher than basic conditional levels of stress, such as pressure, temperature, vibration, voltage, or load to induce early failures. In this paper, a step stress partially accelerated life test (SS-PALT) is regarded under the progressive type-II censored data with random removals. The removals from the test are considered to have the binomial distribution. The life times of the testing items are assumed to follow length-biased weighted Lomax distribution. The maximum likelihood method… More >

Amer Ibrahim Al-Omari^1,*, Ibrahim M. Almanjahie^2,3, Olena Kravchuk⁴

CMC-Computers, Materials & Continua, Vol.67, No.1, pp. 285-301, 2021, DOI:10.32604/cmc.2021.014537

Abstract In this paper, we considered the Length-biased weighted Lomax distribution and constructed new acceptance sampling plans (ASPs) where the life test is assumed to be truncated at a pre-assigned time. For the new suggested ASPs, the tables of the minimum samples sizes needed to assert a specific mean life of the test units are obtained. In addition, the values of the corresponding operating characteristic function and the associated producer’s risks are calculated. Analyses of two real data sets are presented to investigate the applicability of the proposed acceptance sampling plans; one data set contains the first failure of 20 small… More >