Kai Kang1,*, Zhiyong Wang2,3
The International Conference on Computational & Experimental Engineering and Sciences, Vol.33, No.3, pp. 1-1, 2025, DOI:10.32604/icces.2025.012678
Abstract Terahertz time-domain spectroscopy (THz-TDS) can be utilized to probe internal parameters of dielectric materials, such as the refractive index. Based on the stress-optic law, stress-induced variations in the refractive index enable the calculation of applied stress through measured changes in the refractive index. This paper introduces a THz-TDS-based methodology for stress field measurement. First, a THz-TDS stress field scanning and imaging system was developed, incorporating an amplitude-field imaging method that maps stress distributions using variations in the amplitude of THz pulses. Second, two analytical algorithms were established: a planar stress analysis algorithm based on THz… More >
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