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    A Novel Multiple Dependent State Sampling Plan Based on Time Truncated Life Tests Using Mean Lifetime

    Pramote Charongrattanasakul1, Wimonmas Bamrungsetthapong2,*, Poom Kumam3

    CMC-Computers, Materials & Continua, Vol.73, No.3, pp. 4611-4626, 2022, DOI:10.32604/cmc.2022.030856

    Abstract The design of a new adaptive version of the multiple dependent state (AMDS) sampling plan is presented based on the time truncated life test under the Weibull distribution. We achieved the proposed sampling plan by applying the concept of the double sampling plan and existing multiple dependent state sampling plans. A warning sign for acceptance number was proposed to increase the probability of current lot acceptance. The optimal plan parameters were determined simultaneously with nonlinear optimization problems under the producer’s risk and consumer’s risk. A simulation study was presented to support the proposed sampling plan. More >

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