Yuanyuan Wang1,*, Yemeng Zhu1, Xiuchuan Chen1, Tongtong Yin1, Shiwei Su2
CMC-Computers, Materials & Continua, Vol.86, No.3, 2026, DOI:10.32604/cmc.2025.072404
- 12 January 2026
Abstract To solve the false detection and missed detection problems caused by various types and sizes of defects in the detection of steel surface defects, similar defects and background features, and similarities between different defects, this paper proposes a lightweight detection model named multiscale edge and squeeze-and-excitation attention detection network (MSESE), which is built upon the You Only Look Once version 11 nano (YOLOv11n). To address the difficulty of locating defect edges, we first propose an edge enhancement module (EEM), apply it to the process of multiscale feature extraction, and then propose a multiscale edge enhancement… More >
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