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    ARTICLE

    Fast and High-Resolution Optical Inspection System for In-Line Detection and Labeling of Surface Defects

    M. Chang1,2,3, Y. C. Chou1,2, P. T. Lin1,2, J. L. Gabayno2,4

    CMC-Computers, Materials & Continua, Vol.42, No.2, pp. 125-140, 2014, DOI:10.3970/cmc.2014.042.125

    Abstract Automated optical inspection systems installed in production lines help ensure high throughput by speeding up inspection of defects that are otherwise difficult to detect using the naked eye. However, depending on the size and surface properties of the products such as micro-cracks on touchscreen panels glass cover, the detection speed and accuracy are limited by the imaging module and lighting technique. Therefore the current inspection methods are still delegated to a few qualified personnel whose limited capacity has been a huge tradeoff for high volume production. In this study, an automated optical technology for in-line surface defect inspection is developed… More >

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