Pramote Charongrattanasakul1, Wimonmas Bamrungsetthapong2,*, Poom Kumam3
Computer Systems Science and Engineering, Vol.46, No.2, pp. 1631-1651, 2023, DOI:10.32604/csse.2023.036179
Abstract A novel adaptive multiple dependent state sampling plan (AMDSSP) was designed to inspect products from a continuous manufacturing process under the accelerated life test (ALT) using both double sampling plan (DSP) and multiple dependent state sampling plan (MDSSP) concepts. Under accelerated conditions, the lifetime of a product follows the Weibull distribution with a known shape parameter, while the scale parameter can be determined using the acceleration factor (AF). The Arrhenius model is used to estimate AF when the damaging process is temperature-sensitive. An economic design of the proposed sampling plan was also considered for the ALT. A genetic algorithm with… More >
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