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  • Open Access

    ARTICLE

    Modified DS np Chart Using Generalized Multiple Dependent State Sampling under Time Truncated Life Test

    Wimonmas Bamrungsetthapong1, Pramote Charongrattanasakul2,*

    CMES-Computer Modeling in Engineering & Sciences, Vol.138, No.3, pp. 2471-2495, 2024, DOI:10.32604/cmes.2023.031433

    Abstract This study presents the design of a modified attributed control chart based on a double sampling (DS) np chart applied in combination with generalized multiple dependent state (GMDS) sampling to monitor the mean life of the product based on the time truncated life test employing the Weibull distribution. The control chart developed supports the examination of the mean lifespan variation for a particular product in the process of manufacturing. Three control limit levels are used: the warning control limit, inner control limit, and outer control limit. Together, they enhance the capability for variation detection. A genetic algorithm can be used… More >

  • Open Access

    ARTICLE

    A Novel Multiple Dependent State Sampling Plan Based on Time Truncated Life Tests Using Mean Lifetime

    Pramote Charongrattanasakul1, Wimonmas Bamrungsetthapong2,*, Poom Kumam3

    CMC-Computers, Materials & Continua, Vol.73, No.3, pp. 4611-4626, 2022, DOI:10.32604/cmc.2022.030856

    Abstract The design of a new adaptive version of the multiple dependent state (AMDS) sampling plan is presented based on the time truncated life test under the Weibull distribution. We achieved the proposed sampling plan by applying the concept of the double sampling plan and existing multiple dependent state sampling plans. A warning sign for acceptance number was proposed to increase the probability of current lot acceptance. The optimal plan parameters were determined simultaneously with nonlinear optimization problems under the producer’s risk and consumer’s risk. A simulation study was presented to support the proposed sampling plan. A comparison between the proposed… More >

  • Open Access

    ARTICLE

    Improved Attribute Chain Sampling Plan for Darna Distribution

    Harsh Tripathi1, Amer Ibrahim Al-Omari2, Mahendra Saha1, Ayed R. A. Alanzi3,*

    Computer Systems Science and Engineering, Vol.38, No.3, pp. 381-392, 2021, DOI:10.32604/csse.2021.015624

    Abstract Recently, the Darna distribution has been introduced as a new lifetime distribution. The two-parameter Darna distribution represents is a mixture of two well-known gamma and exponential distributions. A manufacturer or an engineer of products conducts life testing to examine whether the quality level of products meets the customer’s requirements, such as reliability or the minimum lifetime. In this article, an attribute modified chain sampling inspection plan based on the time truncated life test is proposed for items whose lifetime follows the Darna distribution. The plan parameters, including the sample size, the acceptance number, and the past lot result of the… More >

  • Open Access

    ARTICLE

    Acceptance Sampling Plans with Truncated Life Tests for the Length-Biased Weighted Lomax Distribution

    Amer Ibrahim Al-Omari1,*, Ibrahim M. Almanjahie2,3, Olena Kravchuk4

    CMC-Computers, Materials & Continua, Vol.67, No.1, pp. 285-301, 2021, DOI:10.32604/cmc.2021.014537

    Abstract In this paper, we considered the Length-biased weighted Lomax distribution and constructed new acceptance sampling plans (ASPs) where the life test is assumed to be truncated at a pre-assigned time. For the new suggested ASPs, the tables of the minimum samples sizes needed to assert a specific mean life of the test units are obtained. In addition, the values of the corresponding operating characteristic function and the associated producer’s risks are calculated. Analyses of two real data sets are presented to investigate the applicability of the proposed acceptance sampling plans; one data set contains the first failure of 20 small… More >

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