Pramote Charongrattanasakul¹, Wimonmas Bamrungsetthapong^2,*, Poom Kumam³

CMC-Computers, Materials & Continua, Vol.73, No.3, pp. 4611-4626, 2022, DOI:10.32604/cmc.2022.030856

Abstract The design of a new adaptive version of the multiple dependent state (AMDS) sampling plan is presented based on the time truncated life test under the Weibull distribution. We achieved the proposed sampling plan by applying the concept of the double sampling plan and existing multiple dependent state sampling plans. A warning sign for acceptance number was proposed to increase the probability of current lot acceptance. The optimal plan parameters were determined simultaneously with nonlinear optimization problems under the producer’s risk and consumer’s risk. A simulation study was presented to support the proposed sampling plan. A comparison between the proposed… More >

Amer Ibrahim Al-Omari^1,*, Ibrahim M. Almanjahie^2,3, Olena Kravchuk⁴

CMC-Computers, Materials & Continua, Vol.67, No.1, pp. 285-301, 2021, DOI:10.32604/cmc.2021.014537

Abstract In this paper, we considered the Length-biased weighted Lomax distribution and constructed new acceptance sampling plans (ASPs) where the life test is assumed to be truncated at a pre-assigned time. For the new suggested ASPs, the tables of the minimum samples sizes needed to assert a specific mean life of the test units are obtained. In addition, the values of the corresponding operating characteristic function and the associated producer’s risks are calculated. Analyses of two real data sets are presented to investigate the applicability of the proposed acceptance sampling plans; one data set contains the first failure of 20 small… More >