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ARTICLE

Properties of X-ray diffraction and Raman scattering in PbSe, PbS and PbS_0,5Se_0,5 thin films

S. N. Yasinova^a,*, S. I. Mekhtiyeva^b, M. H. Huseynaliyev^a, R. I. Alekberov^b

a The Ministry of Science and Education of Azerbaijan, Institute of NaturalResources, H.Aliyev ave. 76, AZ7000, Nakhchivan,Baku, Azerbaijan
b The Ministry of Science and Education of Azerbaijan, Institute of Physics named after Academician Hasan Abdullayev,G. Javid ave 131, AZ1143. Baku, Azerbaijan

* Corresponding Author:

Chalcogenide Letters 2024, 21(5), 377-383. https://doi.org/10.15251/CL.2024.215.377

Received 13 January 2024; Accepted 02 May 2024;

Abstract

Structural properties of PbSe, PbS and PbS_0.5Se_0.5 thin films and mechanisms of combinational scattering of light from phonons were studied by X-ray diffraction and Raman spectroscopy methods. The results of X-ray diffraction show that the crystallite sizes found in the thin layers of the studied substances are in the order of nanometers and vary in the interval d~10.7 ÷ 30.8 nm. It was determined that the scattering bands of the PbSe_0.5S_0.5 sample with large nanoparticle sizes shift to the region of large wave numbers compared to the scattering bands observed in the region of low wave numbers.

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Keywords

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