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Growth Techniques and Phase Characterization of Sn1−xErxTe Crystals

Mammadov Israil Musa*

Faculty of Physics, Azerbaijan State Pedagogical University, 68 U. Gadzhibekli Str., Baku, Azerbaijan

* Corresponding Author: Mammadov Israil Musa. Email: email

Chalcogenide Letters 2026, 23(4), 1 https://doi.org/10.32604/cl.2026.075947

Abstract

Erbium-doped SnTe (Sn1−xErxTe) single crystals were synthesized to investigate the influence of erbium incorporation on phase stability, crystal structure, and thermophysical behavior relevant to thermoelectric applications. Single crystals with nominal compositions x = 0.00–0.10 were grown using the vertical Bridgman technique under controlled thermal conditions. X-ray diffraction analysis confirmed that at low erbium concentrations (x ≤ 0.02–0.03), erbium is substitutionally incorporated into the cubic NaCl-type SnTe lattice without detectable secondary phases. At higher erbium contents (x ≥ 0.05), Er-rich secondary phases such as ErTe and Er2Te3 precipitate within the SnTe matrix, indicating a limited solubility of erbium in SnTe. Differential thermal analysis revealed reproducible thermal effects associated with phase transformations and the formation of secondary phases at elevated dopant concentrations. Scanning electron microscopy combined with energy-dispersive spectroscopy showed microstructural refinement and increased defect density with increasing erbium content. Moderate erbium incorporation enhances phonon scattering, resulting in reduced lattice thermal conductivity and an increased Seebeck coefficient, whereas excessive doping leads to phase instability and degradation of electrical transport. These results demonstrate that erbium acts as an effective dopant for tuning the thermoelectric properties of SnTe within a narrow compositional window, while exceeding the solubility limit induces multiphase behavior and structural instability. The study provides experimentally grounded guidelines for controlled rare-earth doping and phase stability optimization in SnTe-based thermoelectric materials.

Keywords

Erbium doping; SnTe single crystals; phase stability; differential thermal analysis; microstructural evolution; thermoelectric properties

Cite This Article

APA Style
Musa, M.I. (2026). Growth Techniques and Phase Characterization of Sn1−xErxTe Crystals. Chalcogenide Letters, 23(4), 1. https://doi.org/10.32604/cl.2026.075947
Vancouver Style
Musa MI. Growth Techniques and Phase Characterization of Sn1−xErxTe Crystals. Chalcogenide Letters. 2026;23(4):1. https://doi.org/10.32604/cl.2026.075947
IEEE Style
M. I. Musa, “Growth Techniques and Phase Characterization of Sn1−xErxTe Crystals,” Chalcogenide Letters, vol. 23, no. 4, pp. 1, 2026. https://doi.org/10.32604/cl.2026.075947



cc Copyright © 2026 The Author(s). Published by Tech Science Press.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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