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A Novel Secure Scan Design Based on Delayed Physical Unclonable Function

Weizheng Wang1,2, Xingxing Gong1, Xiangqi Wang3, Gwang-jun Kim4,*, Fayez Alqahtani5, Amr Tolba6

1 School of Computer and Communication Engineering, Changsha University of Science and Technology, Changsha, 410114, China
2 College of Information Science and Engineering, Hunan Women’s University, Changsha, 410138, China
3 College of Mathematics and Computational Science, Hunan First Normal University, Changsha, 410138, China
4 Department of Computer Engineering, Chonnam National University, Gwangju, 61186, Korea
5 Software Engineering Department, College of Computer and Information Sciences, King Saud University, Riyadh, 12372, Saudi Arabia
6 Computer Science Department, Community College, King Saud University, Riyadh, 11437, Saudi Arabia

* Corresponding Author: Gwang-jun Kim. Email: email

Computers, Materials & Continua 2023, 74(3), 6605-6622. https://doi.org/10.32604/cmc.2023.031617

Abstract

The advanced integrated circuits have been widely used in various situations including the Internet of Things, wireless communication, etc. But its manufacturing process exists unreliability, so cryptographic chips must be rigorously tested. Due to scan testing provides high test coverage, it is applied to the testing of cryptographic integrated circuits. However, while providing good controllability and observability, it also provides attackers with a backdoor to steal keys. In the text, a novel protection scheme is put forward to resist scan-based attacks, in which we first use the responses generated by a strong physical unclonable function circuit to solidify fuse-antifuse structures in a non-linear shift register (NLSR), then determine the scan input code according to the configuration of the fuse-antifuse structures and the styles of connection between the NLSR cells and the scan cells. If the key is right, the chip can be tested normally; otherwise, the data in the scan chain cannot be propagated normally, it is also impossible for illegal users to derive the desired scan data. The proposed technique not only enhances the security of cryptographic chips, but also incurs acceptable overhead.

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Cite This Article

APA Style
Wang, W., Gong, X., Wang, X., Kim, G., Alqahtani, F. et al. (2023). A novel secure scan design based on delayed physical unclonable function. Computers, Materials & Continua, 74(3), 6605-6622. https://doi.org/10.32604/cmc.2023.031617
Vancouver Style
Wang W, Gong X, Wang X, Kim G, Alqahtani F, Tolba A. A novel secure scan design based on delayed physical unclonable function. Comput Mater Contin. 2023;74(3):6605-6622 https://doi.org/10.32604/cmc.2023.031617
IEEE Style
W. Wang, X. Gong, X. Wang, G. Kim, F. Alqahtani, and A. Tolba "A Novel Secure Scan Design Based on Delayed Physical Unclonable Function," Comput. Mater. Contin., vol. 74, no. 3, pp. 6605-6622. 2023. https://doi.org/10.32604/cmc.2023.031617



cc This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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