Weizheng Wang1,2, Xingxing Gong1, Xiangqi Wang3, Gwang-jun Kim4,*, Fayez Alqahtani5, Amr Tolba6
CMC-Computers, Materials & Continua, Vol.74, No.3, pp. 6605-6622, 2023, DOI:10.32604/cmc.2023.031617
Abstract The advanced integrated circuits have been widely used in various situations including the Internet of Things, wireless communication, etc. But its manufacturing process exists unreliability, so cryptographic chips must be rigorously tested. Due to scan testing provides high test coverage, it is applied to the testing of cryptographic integrated circuits. However, while providing good controllability and observability, it also provides attackers with a backdoor to steal keys. In the text, a novel protection scheme is put forward to resist scan-based attacks, in which we first use the responses generated by a strong physical unclonable function circuit to solidify fuse-antifuse structures… More >
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