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Correction: Micro-Locational Fine Dust Prediction Utilizing Machine Learning and Deep Learning Models

Seoyun Kim1,#, Hyerim Yu2,#, Jeewoo Yoon1,3, Eunil Park1,2,*

1 Department of Applied Artificial Intelligence, Sungkyunkwan University, Seoul, 03063, Korea
2 Department of Human-Artificial Intelligence Interaction, Sungkyunkwan University, Seoul, 03063, Korea
3 AI Team, Raon Data, Seoul, 03073, Korea
* Corresponding Author: Eunil Park. Email: eunilpark@skku.edu
# These two authors contributed equally to this work

Computer Systems Science and Engineering 2024, 48(3), 861-861. https://doi.org/10.32604/csse.2024.053659

This article is a correction of:

Micro-Locational Fine Dust Prediction Utilizing Machine Learning and Deep Learning Models
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APA Style
Kim, S., Yu, H., Yoon, J., Park, E. (2024). Correction: micro-locational fine dust prediction utilizing machine learning and deep learning models. Computer Systems Science and Engineering, 48(3), 861-861. https://doi.org/10.32604/csse.2024.053659
Vancouver Style
Kim S, Yu H, Yoon J, Park E. Correction: micro-locational fine dust prediction utilizing machine learning and deep learning models. Comput Syst Sci Eng. 2024;48(3):861-861 https://doi.org/10.32604/csse.2024.053659
IEEE Style
S. Kim, H. Yu, J. Yoon, and E. Park "Correction: Micro-Locational Fine Dust Prediction Utilizing Machine Learning and Deep Learning Models," Comput. Syst. Sci. Eng., vol. 48, no. 3, pp. 861-861. 2024. https://doi.org/10.32604/csse.2024.053659



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