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Adaptive Multicale Transformation Run-Length Code-Based Test Data Compression in Benchmark Circuits

P. Thilagavathi*, S. Karthikeyan

Department of Electronics and Communication Engineering, K.S.R. College of Engineering, Tiruchengode, 637215, Tamilnadu, India

* Corresponding Author: P. Thilagavathi. Email: email

Intelligent Automation & Soft Computing 2022, 34(3), 2035-2050.


Test data volume reduction and power consumption during testing time outlines are two main problems for Very Large Scale Integration (VLSI) gadgets. Most the code-based arrangements have been utilized to diminish test data volume, although the most notable way that test data volume is high. The switching action that happens between the test carriers leads would expand power consumption. This work presents a compression/decompression methodology for limiting the amount of test data that should be kept on a tester and conveyed to each center in a System on a Chip (SOC) during a test utilizing the Adaptive Multiscale Transformation Run Length Code (AMT-RLC). The data transmission capacity between the tester and the SOC is a block when testing modern SOCs with a few centers to check how long the test can run. The proposed work keeps the tester in the SOC and the test vectors in a compacted memory structure. A modest quantity of On-chip equipment is needed to release different test vectors. Due to its variouscharacteristics that decrease the test data volume, the Adaptive Multiscale Transformation Run Length Code is picked for a center test vector framework. These attributes ensure that the code words overhead is decoded (and applied to the center's output exhibit grouping commitment) utilizing an exact cell cluster that occupies less space. The suggested strategy may provide test data compression with much-reduced Area overhead for the decoder and low power consumption, according to the results. The abstract shall be running continuously (not structured) and shall not include reference citations. Abbreviations should be defined in full the first time they appear. Abbreviations could be then used, quoted in-between parentheses.


Cite This Article

P. Thilagavathi and S. Karthikeyan, "Adaptive multicale transformation run-length code-based test data compression in benchmark circuits," Intelligent Automation & Soft Computing, vol. 34, no.3, pp. 2035–2050, 2022.

cc This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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