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RETRACTION

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Retraction: Line Trace Effective Comparison Algorithm Based on Wavelet Domain DTW

by Nan Pan1,*, Yi Liu2, Dilin Pan2, Junbing Qian1, Gang Li3

1 Faculty of Civil Aviation and Aeronautical, Kunming University of Science & Technology, Kunming, 650500, China
2 Kunming SNLab Tech Co., Ltd., Kunming, 650228, China
3 Institute of Forensic Science, Shijiazhuang Public Security Bureau, Shijiazhuang, 050021, China

* Corresponding Author: Nan Pan. Email: email

Intelligent Automation & Soft Computing 2025, 40, 145-145. https://doi.org/10.32604/iasc.2025.062707

This article is a retraction of:

Line Trace Effective Comparison Algorithm Based on Wavelet Domain DTW
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APA Style
Pan, N., Liu, Y., Pan, D., Qian, J., Li, G. (2025). Retraction: line trace effective comparison algorithm based on wavelet domain DTW. Intelligent Automation & Soft Computing, 40(1), 145–145. https://doi.org/10.32604/iasc.2025.062707
Vancouver Style
Pan N, Liu Y, Pan D, Qian J, Li G. Retraction: line trace effective comparison algorithm based on wavelet domain DTW. Intell Automat Soft Comput. 2025;40(1):145–145. https://doi.org/10.32604/iasc.2025.062707
IEEE Style
N. Pan, Y. Liu, D. Pan, J. Qian, and G. Li, “Retraction: Line Trace Effective Comparison Algorithm Based on Wavelet Domain DTW,” Intell. Automat. Soft Comput., vol. 40, no. 1, pp. 145–145, 2025. https://doi.org/10.32604/iasc.2025.062707



cc Copyright © 2025 The Author(s). Published by Tech Science Press.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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