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Retraction: Line Trace Effective Comparison Algorithm Based on Wavelet Domain DTW

Nan Pan1,*, Yi Liu2, Dilin Pan2, Junbing Qian1, Gang Li3

1 Faculty of Civil Aviation and Aeronautical, Kunming University of Science & Technology, Kunming, 650500, China
2 Kunming SNLab Tech Co., Ltd., Kunming, 650228, China
3 Institute of Forensic Science, Shijiazhuang Public Security Bureau, Shijiazhuang, 050021, China

* Corresponding Author: Nan Pan. Email: email

Intelligent Automation & Soft Computing 2025, 40, 145-145. https://doi.org/10.32604/iasc.2025.062707

This article is a retraction of:

Line Trace Effective Comparison Algorithm Based on Wavelet Domain DTW
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Abstract

This article has no abstract.

Intelligent Automation & Soft Computing has retracted the article titled “Line Trace Effective Comparison Algorithm Based on Wavelet Domain DTW” [1], Intell Automat Soft Comput. 2019;25(2):359–366 at the request of the authors.

DOI: 10.31209/2019.100000097

URL: https://www.techscience.com/iasc/v25n2/39663

The article duplicates significant parts of a paper published in Journal of Intelligent & Fuzzy Systems [2]. One of the conditions of submission of a paper for publication is that authors declare explicitly that the paper has not been previously published and is not under consideration for publication elsewhere. Re-use of any data should be appropriately cited. As such this article represents a misuse of the scientific publishing system.

The article is therefore being retracted at the request of the Editor-in-Chief and the editorial board. All authors have agreed to this retraction. As a responsible publisher, we hold the reliability and integrity of our published content in high regard. We deeply regret any inconvenience caused by this situation to our readers and all concerned parties.

References

1. Pan N, Liu Y, Pan D, Qian J, Li G. Line trace effective comparison algorithm based on wavelet domain DTW. Intell Automat Soft Comput. 2019;25(2):359–66. doi:10.31209/2019.100000097.

2. Pan N, Kan L, Liu Y, Fu W, Hou Z, Li G, et al. Nonlinear tool traces fast tracing algorithm based on single point laser detection. Journal of Intelligent & Fuzzy Systems. 2019;36(2):1109–20. doi:10.3233/JIFS-169885.


Cite This Article

APA Style
Pan, N., Liu, Y., Pan, D., Qian, J., Li, G. (2025). Retraction: Line Trace Effective Comparison Algorithm Based on Wavelet Domain DTW. Intelligent Automation & Soft Computing, 40(1), 145–145. https://doi.org/10.32604/iasc.2025.062707
Vancouver Style
Pan N, Liu Y, Pan D, Qian J, Li G. Retraction: Line Trace Effective Comparison Algorithm Based on Wavelet Domain DTW. Intell Automat Soft Comput. 2025;40(1):145–145. https://doi.org/10.32604/iasc.2025.062707
IEEE Style
N. Pan, Y. Liu, D. Pan, J. Qian, and G. Li, “Retraction: Line Trace Effective Comparison Algorithm Based on Wavelet Domain DTW,” Intell. Automat. Soft Comput., vol. 40, no. 1, pp. 145–145, 2025. https://doi.org/10.32604/iasc.2025.062707


cc Copyright © 2025 The Author(s). Published by Tech Science Press.
This work is licensed under a Creative Commons Attribution 4.0 International License , which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.
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