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    ARTICLE

    Digital Twin-Based Automated Fault Diagnosis in Industrial IoT Applications

    Samah Alshathri1, Ezz El-Din Hemdan2, Walid El-Shafai3,4,*, Amged Sayed5,6

    CMC-Computers, Materials & Continua, Vol.75, No.1, pp. 183-196, 2023, DOI:10.32604/cmc.2023.034048

    Abstract In recent years, Digital Twin (DT) has gained significant interest from academia and industry due to the advanced in information technology, communication systems, Artificial Intelligence (AI), Cloud Computing (CC), and Industrial Internet of Things (IIoT). The main concept of the DT is to provide a comprehensive tangible, and operational explanation of any element, asset, or system. However, it is an extremely dynamic taxonomy developing in complexity during the life cycle that produces a massive amount of engendered data and information. Likewise, with the development of AI, digital twins can be redefined and could be a crucial approach to aid the… More >

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