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  • Open Access

    ARTICLE

    Comparative Study on Tool Fault Diagnosis Methods Using Vibration Signals and Cutting Force Signals by Machine Learning Technique

    Suhas S. Aralikatti1, K. N. Ravikumar1, Hemantha Kumar1,*, H. Shivananda Nayaka1, V. Sugumaran2

    Structural Durability & Health Monitoring, Vol.14, No.2, pp. 127-145, 2020, DOI:10.32604/sdhm.2020.07595

    Abstract The state of cutting tool determines the quality of surface produced on the machined parts. A faulty tool produces poor surface, inaccurate geometry and non-economic production. Thus, it is necessary to monitor tool condition for a machining process to have superior quality and economic production. In the present study, fault classification of single point cutting tool for hard turning has been carried out by employing machine learning technique. Cutting force and vibration signals were acquired to monitor tool condition during machining. A set of four tooling conditions namely healthy, worn flank, broken insert and extended tool overhang have been considered… More >

  • Open Access

    ARTICLE

    Within-Project and Cross-Project Software Defect Prediction Based on Improved Transfer Naive Bayes Algorithm

    Kun Zhu1, Nana Zhang1, Shi Ying1, *, Xu Wang2

    CMC-Computers, Materials & Continua, Vol.63, No.2, pp. 891-910, 2020, DOI:10.32604/cmc.2020.08096

    Abstract With the continuous expansion of software scale, software update and maintenance have become more and more important. However, frequent software code updates will make the software more likely to introduce new defects. So how to predict the defects quickly and accurately on the software change has become an important problem for software developers. Current defect prediction methods often cannot reflect the feature information of the defect comprehensively, and the detection effect is not ideal enough. Therefore, we propose a novel defect prediction model named ITNB (Improved Transfer Naive Bayes) based on improved transfer Naive Bayesian algorithm in this paper, which… More >

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