E. Poovannan^*, S. Karthik

CMC-Computers, Materials & Continua, Vol.74, No.1, pp. 2161-2177, 2023, DOI:10.32604/cmc.2023.032512

Abstract The difference between circuit design stage and time requirements has broadened with the increasing complexity of the circuit. A big database is needed to undertake important analytical work like statistical method, heat research, and IR-drop research that results in extended running times. This unit focuses on the assessment of test strength. Because of the enormous number of successful designs for current models and the unnecessary time required for every test, maximum energy ratings with all tests cannot be achieved. Nevertheless, test safety is important for producing trustworthy findings to avoid loss of output and harm to the chip. Generally, effective… More >

M. Sundar Prakash Balaji^1,*, V. R. Vijaykumar², Kamalraj Subramaniam³, M. Kannan⁴, V. Ayyem Pillai⁵

Intelligent Automation & Soft Computing, Vol.35, No.3, pp. 3155-3168, 2023, DOI:10.32604/iasc.2023.028969

Abstract The current research work proposed a novel optimization-based 2D-SIMM (Two-Dimensional Sine Iterative chaotic map with infinite collapse Modulation Map) model for image encryption. The proposed 2D-SIMM model is derived out of sine map and Iterative Chaotic Map with Infinite Collapse (ICMIC). In this technique, scrambling effect is achieved with the help of Chaotic Shift Transform (CST). Chaotic Shift Transform is used to change the value of pixels in the input image while the substituted value is cyclically shifted according to the chaotic sequence generated by 2D-SIMM model. These chaotic sequences, generated using 2D-SIMM model, are sensitive to initial conditions. In… More >